Resistance Measurement System
NAPSON: SPREADING RESISTANCE MEASUREMENT SYSTEM
- Single point, Contact Type by TOW Kinematically-Mounted Probe
- For slanting polished sample of semiconductor
- Resitivity map with depth direction, thickness of epitaxial, depth of PN junction and carrier density profiles
- Measure Range:
- Spread Resistance (Ω): 1 to 10E9
- Carrier Density (N-Type): 2E13 to 5E19 cm2
- Carrier Density (P-Type): 2E14 to 7E19 cm2
- Sample Size: On Request
Datasheet Download:
Technical Notes Download:
LOOKING FOR TEST AND MEASUREMENT INSTRUMENTS?
Our team provides product guidance and recommendation as well as technical support.