Lifetime Measurement System
NAPSON: LIFETIME MEASUREMENT SYSTEM
- The lifetime measurement system analyze and evaluate the material purity and defect density
- HR-90R:
- Single Point, Non-Contact using photoconduction vibration decay method
- Measure Range: 100uS to 5000uS
- HF-100DCA:
- Single Point, Contact Type using JIS direct current anodizing method
- Global standard model for the lifetime test of silicon bulk
- Measure Range: 50uS to 20mS
- Software data processing using Digital Oscilloscope
- Silicon ingot, Silicon bulk, Prismatic shape (JIS code)
Datasheet Download:
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